“Materials Characterization by Advanced Specimen Preparation Methods and Analytical Electron Microscopy”
نویسندگان
چکیده
منابع مشابه
Specimen Preparation for Electron Microscopy
In general the SEM sample preparation techniques are more or less similar to the metallographic sample preparation technique for optical microscopy, because both the microscopes reveals the surface topography of sample. In SEM a focussed beam of electrons scans over the specimen surface and the electrons emitted from the sample surface controls the brightness of the CRT spot which also scans th...
متن کاملSpecimen collection for electron microscopy.
were “unknown agents.” For the sake of objectivity, we based our assumption on the aggregate of information for known pathogens rather than on “expert opinion.” Interestingly, however, the Council of Science and Technology’s “expert opinion” of the percentage of diarrheal illness due to foodborne transmission was 35% (1), nearly identical to the figure we developed. As noted in our article, pat...
متن کاملScanning electron microscopy for materials characterization
Current materials are usually complex in chemistry, three-dimensional in form, and of rapidly diminishing microstructural scale. To characterize such materials the scanning electron microscope (SEM) now uses a wide range of operating conditions to target the desired sample volume, sophisticated modeling techniques to interpret the data. It also uses novel imaging modes to derive new types of in...
متن کاملSpecimen collection for electron microscopy.
analysis of PCR products amplified from five strains of spotted fever group Rickettsiae with Rr with Rr 190. synthase gene comparison, a new tool for phylogenetic analysis, and its application for the Rickettsiae. To the Editor: As virologists whose specialties include diagnostic electron microscopy (EM), we read with interest the discussion on bioterrorism scenarios (1,2) and the subsequent no...
متن کاملCryo-electron Microscopy Specimen Preparation By Means Of a Focused Ion Beam
Here we present a protocol used to prepare cryo-TEM samples of Aspergillus niger spores, but which can easily be adapted for any number of microorganisms or solutions. We make use of a custom built cryo-transfer station and a modified cryo-SEM preparation chamber. The spores are taken from a culture, plunge-frozen in a liquid nitrogen slush and observed in the cryo-SEM to select a region of int...
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ژورنال
عنوان ژورنال: Journal of the Japan Institute of Metals
سال: 2004
ISSN: 0021-4876
DOI: 10.2320/jinstmet.68.263